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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering)From CRC Pr
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The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
- Sales Rank: #4037844 in Books
- Published on: 1991-07-25
- Original language: English
- Number of items: 1
- Dimensions: 10.24" h x 1.76" w x 7.26" l, 3.46 pounds
- Binding: Hardcover
- 856 pages
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